PROGRAMMABLE OPTICAL ATTENUATOR DIMENSION

Optical Attenuator Communication Equipment

Optical Attenuator Communication Equipment

Optical attenuators are commonly used in fiber-optic communications, either to test power level margins by temporarily adding a calibrated amount of signal loss, or installed permanently to properly match transmitter and receiver levels. The power reduction is done by such means as absorption, reflection, diffusion, scattering, deflection, diffraction, and dispersion, etc.

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Switch-type optical attenuator

Switch-type optical attenuator

An optical attenuator, or fiber optic attenuator, is a device used to reduce the power level of an optical signal, either in free space or in an optical fiber. The basic types of optical attenuators are fixed, step-wise variable, and continuously variable. The power reduction is done by such means as absorption, reflection, diffusion, scattering, deflection, diffraction, and dispersion, etc.

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The function of driving the optical attenuator

The function of driving the optical attenuator

Optical attenuators are critical devices used in managing the intensity of optical signals in fiber optic communications. Key requirements include minimal effect on the beam profile, low wavelength and polarization dependence, and sufficient power handling capability. The attenuator circuit will allow a known source of power to be reduced by a predetermined factor, which is usually expressed as decibels.

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Optical Dimension D22 Spectrometer

Optical Dimension D22 Spectrometer

D22 possesses the largest area multidetector (3 He) of all small-angle scattering instruments (active area 1 m 2), with a pixel size of 0. This guide provides some simple and easy to use design guidelines and formulas for designing, evaluating and comparing various diode array, diffraction grating based spectrometers designs The input to the design process is the wavelength range you want to cover and the optical resolution by which. Optical spectroscopy is a technique that is used to measure light intensity in the ultraviolet (UV), visible (VIS), near-infrared (NIR), and infrared (IR) range of the electromagnetic spectrum. Optical scatterometry or optical critical dimension (OCD) is one of the most prevalent inline metrology techniques in semiconductor manufacturing because it is a quick, precise and non-destructive metrology technique.

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